Incorporating Generalized Modified Weibull TEF in to Software Reliability Growth Model and Analysis of Optimal Release Policy | Zendy

Shaik Mohammad Rafi | Zendy; K. Nageswara Rao | Zendy; Shaheda Akthar | Zendy

Open Access

Incorporating Generalized Modified Weibull TEF in to Software Reliability Growth Model and Analysis of Optimal Release Policy

Author(s) -

Shaik Mohammad Rafi,

K. Nageswara Rao,

Shaheda Akthar

Publication year - 2010

Publication title -

computer and information science

Language(s) - English

Resource type - Journals

eISSN - 1913-8997

pISSN - 1913-8989

DOI - 10.5539/cis.v3n2p145

Subject(s) - computer science , software quality , weibull distribution , reliability engineering , software release life cycle , reliability (semiconductor) , context (archaeology) , software , software reliability testing , process (computing) , software development , statistics , power (physics) , physics , operating system , mathematics , engineering , paleontology , quantum mechanics , biology , programming language

Software reliability is generally a key factor in software quality. Reliability is an essential ingredient in customer satisfaction. In software development process reliability conveys the information to managers to access the testing effort and time at which software release into the market. Large numbers of papers are published in this context. In this paper we proposed a software reliability growth model with generalized modified weibull testing effort. Performance application of proposed model is demonstrated through real datasets. The experimental results shown that the model gives an excellent performance compared to other models. We also discuss the optimal release time based on reliability requirement and cost criteria.

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