SCLC Degradation in 980 nm Pump Laser by Using Electrical Noise | Zendy

B. Orsal | Zendy; I. Asaad | Zendy

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SCLC Degradation in 980 nm Pump Laser by Using Electrical Noise

Author(s) -

B. Orsal,

I. Asaad

Publication year - 2012

Publication title -

isrn optics

Language(s) - English

Resource type - Journals

ISSN - 2090-7826

DOI - 10.5402/2012/841695

Subject(s) - noise (video) , noise spectral density , materials science , noise power , spectral density , diode , optoelectronics , laser , spectral line , flicker noise , noise generator , shot noise , space charge , degradation (telecommunications) , optics , physics , power (physics) , noise figure , electrical engineering , telecommunications , amplifier , cmos , quantum mechanics , astronomy , artificial intelligence , computer science , image (mathematics) , electron , detector , engineering

The knowledge of the noise levels is important for pump laser diodes as it allows to study and to locate the noise sources and their origin. 980 nm fresh and aged pump lasers have been characterized by using electrical noise measurements. At 10 Hz, the spectra are dominated by 1/ (1≤≤2) noise. Current noise spectral density (CNSD) is dominated by (1<≤2). The trapping defect density near the n

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