The Effect of Film Thickness on the Structural Properties of Vacuum Evaporated Poly(3-methylthiophene) Thin Films
Author(s) -
Sandip V. Kamat,
Vijaya Puri,
R.K. Puri
Publication year - 2012
Publication title -
isrn polymer science
Language(s) - English
Resource type - Journals
ISSN - 2090-8733
DOI - 10.5402/2012/570363
Subject(s) - materials science , wetting , thin film , composite material , adhesion , vacuum evaporation , morphology (biology) , surface roughness , surface finish , evaporation , carbon film , nanotechnology , physics , biology , genetics , thermodynamics
This paper reports on the structural properties of poly(3-methylthiophene) P3MeT thin films prepared by vacuum evaporation on the glass substrates. The structural and surface morphology, wettability, adhesion, and intrinsic stress of these thin films were studied for three different thicknesses. The variation of the film thickness affects the structure, surface, and mechanical properties of P3MeT thin films. Vapor chopping also strongly influences the surface morphology, surface roughness, and wettability of the thin films. It was found that there is a decrease in the intrinsic stress and (RMS) roughness, while the adhesion increases with increase in film thickness.
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