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Design of Intelligent Insulation Degradation Sensor
Author(s) -
Yi-Gon Kim
Publication year - 2002
Publication title -
international journal of fuzzy logic and intelligent systems
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.296
H-Index - 9
eISSN - 2093-744X
pISSN - 1598-2645
DOI - 10.5391/ijfis.2002.2.3.191
Subject(s) - microcontroller , microprocessor , degradation (telecommunications) , partial discharge , reliability engineering , warning system , fuzzy logic , line (geometry) , computer science , engineering , automotive engineering , electrical engineering , voltage , telecommunications , artificial intelligence , geometry , mathematics
Insulation aging diagnosis system provides early warning in regard to electrical equipment defects. Early warning is very important in that it can avoid great losses resulting from unexpected shutdown of the production line. For solving this problem, many researchers proposed a method that diagnose power plant by using partial discharge. In this paper, we design the intelligent sensor to diagnose insulation degradation state that uses a Microprocessor and Al. Proposed sensor has MCU that is used to diagnose insulation degradation and communicate with main IDD system. And we use a fuzzy model to diagnose insulation degradation.

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