A mixed control chart adapted to the truncated life test based on the Weibull distribution

In this manuscript, the design of a new mixed attribute control chart adapted to a truncated life test is presented. It is assumed that the lifetime of a product follows the Weibull distribution and the number of failures is observed using a truncated life test, where the test duration is specified as a fraction of the mean lifespan. The proposed control chart consists of two pairs of control limits based on a binomial distribution and one lower bound. The average run length of the proposed chart is determined for various levels of shift constants and specified parameters. The efficiency of the proposed chart is compared with an existing control chart in terms of the average run length. The application of the proposed chart is discussed with the aid of a simulation study.