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U-Net based Zero-hour Defect Inspection of Electronic Components and Semiconductors
Author(s) -
Florian Kälber,
Okan Köpüklü,
Nicolas Lehment,
Gerhard Rigoll
Publication year - 2021
Publication title -
proceedings of the 17th international joint conference on computer vision, imaging and computer graphics theory and applications
Language(s) - English
Resource type - Conference proceedings
DOI - 10.5220/0010320205930601
Subject(s) - zero (linguistics) , net (polyhedron) , semiconductor , computer science , materials science , optoelectronics , mathematics , geometry , philosophy , linguistics

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