Post-deposition Annealing Controlled Structural And Optical Properties Of RF Magnetron Sputtered MoO3 Films
Author(s) -
S. Subbarayudu,
V. Madhavi S. Uthanna
Publication year - 2013
Publication title -
advanced materials letters
Language(s) - English
Resource type - Journals
eISSN - 0976-397X
pISSN - 0976-3961
DOI - 10.5185/amlett.2012.11466
Subject(s) - materials science , band gap , nanocrystalline material , sputter deposition , crystallite , refractive index , analytical chemistry (journal) , annealing (glass) , crystallinity , scanning electron microscope , thin film , amorphous solid , sputtering , optics , optoelectronics , crystallography , nanotechnology , composite material , metallurgy , chemistry , physics , chromatography
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