Test-Retest Reliability of the Components of Multi-Frequency Tympanometry | Zendy

Prashanth Prabhu | Zendy; Shradha Manandhar | Zendy; Begum Nasima Ahmed | Zendy

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Test-Retest Reliability of the Components of Multi-Frequency Tympanometry

Author(s) -

Prashanth Prabhu,

Shradha Manandhar,

Begum Nasima Ahmed

Publication year - 2017

Publication title -

the journal of international advanced otology

Language(s) - English

Resource type - Journals

SCImago Journal Rank - 0.518

H-Index - 13

eISSN - 2148-3817

pISSN - 1308-7649

DOI - 10.5152/iao.2017.3479

Subject(s) - tympanometry , reliability (semiconductor) , medicine , audiology , test (biology) , session (web analytics) , reliability engineering , audiometry , hearing loss , computer science , paleontology , power (physics) , physics , quantum mechanics , world wide web , biology , engineering

Multi-frequency tympanometry and its components are extensively used to identify middle ear disorders. However, there are a limited number of studies that have attempted to determine its test-retest reliability. Thus, the present study attempted to determine the test-retest reliability of the different components of multi-frequency tympanometry.

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