Test Generation for Analog and Mixed-Signal Circuits Using Hybrid System Models | Zendy

Tarik Nahhal | Zendy; Thao Dang | Zendy

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Test Generation for Analog and Mixed-Signal Circuits Using Hybrid System Models

Author(s) -

Tarik Nahhal,

Thao Dang

Publication year - 2011

Publication title -

international journal of vlsi design and communication systems

Language(s) - English

Resource type - Journals

eISSN - 0976-1357

pISSN - 0976-1527

DOI - 10.5121/vlsic.2011.2302

Subject(s) - mixed signal integrated circuit , analogue electronics , test (biology) , computer science , electronic circuit , signal (programming language) , electronic engineering , electrical engineering , engineering , paleontology , programming language , biology

In this paper we propose an approach for testing time-domain properties of analog and mixed-signal circuits. The approach is based on an adaptation of a recently developed test generation technique for hybrid systems and a new concept of coverage for such systems. The approach is illustrated by its application to some benchmark circuits.

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