Open AccessThin-film characterization by picosecond ultrasonics on high curvature surfaces
Author(s) -
Frédéric Faëse,
J. Michelon,
Xavier Tridon
Publication year - 2020
Publication title -
hal (le centre pour la communication scientifique directe)
Language(s) - English
Resource type - Conference proceedings
DOI - 10.48465/fa.2020.0085
Subject(s) - characterization (materials science) , materials science , curvature , picosecond , optics , thin film , optoelectronics , nanotechnology , physics , geometry , laser , mathematics
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