Modélisation des sources de bruit dans les dispositifs MOS | Zendy

AG Bouazza | Zendy; H. Sahraoui | Zendy; B Bouazzao | Zendy; KE Ghaffouro | Zendy; NEC Sari | Zendy

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Modélisation des sources de bruit dans les dispositifs MOS

Author(s) -

AG Bouazza,

H. Sahraoui,

B Bouazzao,

KE Ghaffouro,

NEC Sari

Publication year - 2010

Publication title -

afrique science revue internationale des sciences et technologie

Language(s) - English

Resource type - Journals

ISSN - 1813-548X

DOI - 10.4314/afsci.v1i2.61122

Subject(s) - flicker noise , noise (video) , noise generator , noise temperature , burst noise , acoustics , noise measurement , noise floor , computer science , electronic engineering , physics , phase noise , engineering , noise figure , noise reduction , cmos , amplifier , artificial intelligence , image (mathematics)

Modeling of noise sources in MOS devices We present in this work an investigation of the physical origins of the two main noise sources in MOS devices. In the first part, we interest to the flicker noise and its detailed derivation’s. The thermal noise is discussed in the second part with the explanation of the channel length impact in this noise. At next, we present briefly the induced gate noise.

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