Open AccessInvestigation of the Contact Resistance Between Amorphous Silicon-Zinc-Tin-Oxide Thin Film Transistors and Different Electrodes Using the Transmission Line Method
Author(s) -
Byeong Hyeon Lee,
Sangmin Han,
Sang Yeol Lee
Publication year - 2016
Publication title -
transactions on electrical and electronic materials
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.201
H-Index - 18
eISSN - 2092-7592
pISSN - 1229-7607
DOI - 10.4313/teem.2016.17.1.46
Subject(s) - materials science , contact resistance , thin film transistor , electrode , amorphous solid , tin , aluminium , analytical chemistry (journal) , titanium , composite material , layer (electronics) , metallurgy , crystallography , chemistry , chromatography
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