Electrical Properties of a CuPc Field-Effect Transistor Using a UV/Ozone Treated and Untreated Substrate
Author(s) -
Ho-Shik Lee,
Min-Woo Cheon,
Yong-Pil Park
Publication year - 2011
Publication title -
transactions on electrical and electronic materials
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.201
H-Index - 18
eISSN - 2092-7592
pISSN - 1229-7607
DOI - 10.4313/teem.2011.12.1.40
Subject(s) - materials science , organic field effect transistor , substrate (aquarium) , optoelectronics , transistor , field effect transistor , silicon , layer (electronics) , ozone , active layer , analytical chemistry (journal) , voltage , nanotechnology , thin film transistor , electrical engineering , organic chemistry , oceanography , chemistry , geology , engineering
An organic field-effect transistor (OFET) was fabricated using a copper phthalocyanine (CuPc) as the active layer on the silicon substrate. The CuPc FET device was configured as a top-contact type. The substrate temperature was room temperature. The CuPc thickness was 40 nm, and the channel length and channel width were 100 μm 3 mm, respectively. Typical current-voltage (I-V) characteristics of the CuPc FET were observed and subsequently compared to the UV/ozone treatment on substrate surface.
Accelerating Research
Robert Robinson Avenue,
Oxford Science Park, Oxford
OX4 4GP, United Kingdom
Address
John Eccles HouseRobert Robinson Avenue,
Oxford Science Park, Oxford
OX4 4GP, United Kingdom