Open AccessLimitations of On-Wafer Calibration and De-Embedding Methods in the Sub-THz Range
Author(s) -
Manuel Potereau,
Christian Raya,
Magali de Matos,
Sébastien Frégonèse,
Arnaud Curutchet,
Min Zhang,
Bertrand Ardouin,
Thomas Zimmer
Publication year - 2013
Publication title -
journal of computer and communications
Language(s) - English
Resource type - Journals
eISSN - 2327-5227
pISSN - 2327-5219
DOI - 10.4236/jcc.2013.16005
Subject(s) - calibration , embedding , wafer , range (aeronautics) , coupling (piping) , limit (mathematics) , line (geometry) , inductive coupling , electronic engineering , physics , computer science , materials science , engineering , optoelectronics , electrical engineering , mathematics , mechanical engineering , mathematical analysis , artificial intelligence , geometry , quantum mechanics , composite material
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