Reliability of SiC Digital Telemetry Circuits on AlN Substrate
Author(s) -
Reza Ghandi,
Cheng-Po Chen,
Liang Yin,
Rich Saia,
Tammy Johnson,
Peter Sandvik,
Kun Fang,
Wayne Johnson
Publication year - 2013
Publication title -
additional conferences (device packaging hitec hiten and cicmt)
Language(s) - English
Resource type - Journals
ISSN - 2380-4491
DOI - 10.4071/hiten-wp16
Subject(s) - materials science , substrate (aquarium) , electronic circuit , reliability (semiconductor) , generator (circuit theory) , shift register , electrical engineering , integrated circuit , digital electronics , silicon carbide , chip , optoelectronics , computer science , electronic engineering , computer hardware , engineering , physics , composite material , power (physics) , oceanography , quantum mechanics , geology
In this work, two silicon carbide based integrated circuits (frequency counter and timing generator) have been designed and fabricated as building blocks of a digital telemetry module for the purpose of sensing and transmitting pressure measurements from a geothermal well at temperatures up to 300°C. The frequency counter consists of one 4-bit counter, one 4-bit shift register, and one buffer. The timing generator contains an 8-bit counter, a D-flipflop, and some dedicated logic gates to generate timing pulses for the two channel frequency counter. These dies were flip-chip bonded to patterned gold thin-film aluminum nitride substrate circuit boards and tested for functionality in a lab oven at 300°C and prove to operate continuously for more than 1000 hours. Also the boards were subjected to random vibration at 20G RMS and also mechanical shock at 215G at 300°C and remained operational after 8 hours of vibration and 1000 shocks.
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