Open AccessExperimental Investigation of Electro-thermal Stress Impact on SiC-BJTs Electrical Characteristics
Author(s) -
T. Chailloux,
Cyril Calvez,
Pascal Bevilacqua,
Dominique Planson,
Dominique Tournier
Publication year - 2013
Publication title -
additional conferences (device packaging hitec hiten and cicmt)
Language(s) - English
Resource type - Journals
ISSN - 2380-4491
DOI - 10.4071/hiten-wp14
Subject(s) - materials science , temperature cycling , junction temperature , stress (linguistics) , bipolar junction transistor , thermal , degradation (telecommunications) , thermal stability , transistor , composite material , optoelectronics , electrical engineering , voltage , engineering , philosophy , linguistics , physics , chemical engineering , meteorology
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