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1200 V 6 A High Temperature SiC BJTs
Author(s) -
Anders Lindgren,
Martin Domeij
Publication year - 2010
Publication title -
additional conferences (device packaging hitec hiten and cicmt)
Language(s) - English
Resource type - Journals
ISSN - 2380-4491
DOI - 10.4071/hitec-alindgren-tp24
Subject(s) - silicon carbide , materials science , bipolar junction transistor , spice , transistor , optoelectronics , atmospheric temperature range , electrical engineering , junction temperature , voltage , composite material , engineering , thermodynamics , power (physics) , physics
Silicon carbide (SiC) bipolar junction transistors (BJTs) are normally-off devices which can block high voltages at high temperature operation. The SiC BJTs can be switched very fast with low losses [2] compared to BJT's made in silicon (Si), and can be operated at temperatures up to and above 250 °C. Vertical 1200V 6A rated NPN SiC BJTs were fabricated and packaged in a high-temperature capable metal package of the type TO-258. The transistors were characterized both statically and in terms of switching. A SPICE model was developed for the transistors, including the parasitic capacitances of the internal pn-junctions, as well as temperature dependence of the current gain and the collector series resistance. Switching measurements were performed showing VCE voltage rise- and fall-times in the range of 20 ns. The switching behavior is in qualitative agreement with SPICE simulations.

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