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2.5D and 3D Integration Technology Update
Author(s) -
Robert Patti
Publication year - 2014
Publication title -
additional conferences (device packaging hitec hiten and cicmt)
Language(s) - English
Resource type - Journals
ISSN - 2380-4491
DOI - 10.4071/2014dpc-ta12
Subject(s) - wafer , perspective (graphical) , cover (algebra) , cmos , semiconductor device fabrication , nanotechnology , computer science , systems engineering , engineering , manufacturing engineering , materials science , electrical engineering , mechanical engineering , artificial intelligence
This publication will cover Tezzaron's latest advancements in 2.5D and 3D technology including new wafer to wafer integration of InP and GaAs with CMOS devices and new work in bonded die to wafer assembly with sub 25um pitch. A manufacturing perspective of the evolving customer requirements and the unique challenges in testing these highly complex devices will be discussed.

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