Wafer Level Package for MEMS with TSVs and Hermetic Seal
Author(s) -
Akinori Shiraishi,
Mitsutoshi Higashi,
Kei Murayama,
Yuichi Taguchi,
Kenichi Mori
Publication year - 2011
Publication title -
additional conferences (device packaging hitec hiten and cicmt)
Language(s) - English
Resource type - Journals
ISSN - 2380-4491
DOI - 10.4071/2011dpc-tha24
Subject(s) - wafer dicing , wafer , microelectromechanical systems , materials science , anodic bonding , wafer level packaging , wafer bonding , soldering , silicon , optoelectronics , seal (emblem) , interconnection , die preparation , etching (microfabrication) , wafer testing , composite material , engineering , layer (electronics) , art , visual arts , telecommunications
In recent years, downsizing of MEMS package and high accuracy MEMS device mounting have been strongly required from expanding applications that using MEMS not only for industrial and automobile but also for consumer typified mobile phone. In order to achieve that, it is appropriate to use Silicon package that can be mounted at wafer level packaging. Silicon package is made of monocrystal silicon wafer. The deep cavity is fabricated on monocrystal silicon wafer by Wet or Dry etching. And MEMS device can be mounted on the cavity. The electrical connecting between front side and back side of cavity portion is achieved by TSVs that located on the bottom of cavity. Hermetic seal can be achieved by using glass or silicon wafer bonding method. By using a driver device wafer (before dicing) as the cap for hermetic seal, smaller size and smaller number of parts module can be fabricated. In this report, methods and designs for hermetic seal with wafer level process were examined. Methods that applied were polyimide adhesive bonding, anodic bonding and Au-In solder bonding. Location of TSVs on the bottom of cavity and thickness of diaphragm with TSVs was also examined. Silicon package for piezo type gyro MEMS that designed by the result of evaluation was fabricated. This package used optimized Au-In solder bonding for hermetic seal and optimized location of TSVs for interconnection. That was designed over 50% thinner than conventional ceramic packages. Characteristics of hermetic seal were evaluated by Q factor of gyro MEMS that mounted inside of the silicon package. It is confirmed that performance of sealing are good enough for running of the MEMS.
Accelerating Research
Robert Robinson Avenue,
Oxford Science Park, Oxford
OX4 4GP, United Kingdom
Address
John Eccles HouseRobert Robinson Avenue,
Oxford Science Park, Oxford
OX4 4GP, United Kingdom