Open AccessAnalysis of Electrodeposited Nickel-Iron Alloy Film Composition Using Particle-Induced X-Ray Emission
Author(s) -
Alyssa A. Frey,
Nicholas Wozniak,
Timothy B. Nagi,
Matthew P. Keller,
J. Mark Lunderberg,
G. F. Peaslee,
P. A. DeYoung,
Jennifer R. Hampton
Publication year - 2011
Publication title -
international journal of electrochemistry
Language(s) - English
Resource type - Journals
eISSN - 2090-3537
pISSN - 2090-3529
DOI - 10.4061/2011/604395
Subject(s) - alloy , crystallite , nickel , materials science , deposition (geology) , analytical chemistry (journal) , metal , thin film , particle (ecology) , x ray , composition (language) , metallurgy , chemistry , nanotechnology , optics , environmental chemistry , paleontology , linguistics , oceanography , physics , philosophy , sediment , geology , biology
The elemental composition of electrodeposited NiFe thin films was analyzed with particle-induced X-ray emission (PIXE). The thin films were electrodeposited on polycrystalline Au substrates from a 100 mM NiSO4, 10 mM FeSO4, 0.5 M H3BO3, and 1 M Na2SO4 solution. PIXE spectra of these films were analyzed to obtain relative amounts of Ni and Fe as a function of deposition potential and deposition time. The results show that PIXE can measure the total deposited metal in a sample over at least four orders of magnitude with similar fractional uncertainties. The technique is also sensitive enough to observe the variations in alloy composition due to sample nonuniformity or variations in deposition parameters
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