Fabricating Pinhole-Free YSZ Sub-Microthin Films by Magnetron Sputtering for Micro-SOFCs
Author(s) -
Theresa. Y. Hill,
Hong Huang
Publication year - 2010
Publication title -
international journal of electrochemistry
Language(s) - English
Resource type - Journals
eISSN - 2090-3537
pISSN - 2090-3529
DOI - 10.4061/2011/479203
Subject(s) - materials science , yttria stabilized zirconia , cubic zirconia , sputter deposition , wafer , nanoporous , thin film , sputtering , oxide , chemical engineering , composite material , nanotechnology , metallurgy , ceramic , engineering
Submicron thin yttria stabilized zirconia (YSZ) films were prepared on a variety of substrates with different surface morphologies by magnetron sputtering followed by thermal oxidation. Pinholes were observed in the films deposited on nanoporous alumina substrates. Initial dense Y/Zr films developed nanocracks after thermal oxidation on smooth Si wafer substrates. At optimal sputtering and oxidation conditions, smooth and crack/pore-free films were achieved on Si wafer substrates. The thin YSZ films exhibited fully ionic conduction with ionic conductivities, and activation energy corroborated well with the values from commercial YSZ plates. The thin YSZ films can be utilized in Solid Oxide Fuel Cells (SOFCs) for intermediate temperature operations
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