Nonstoichiometric tin oxide films: study by X-ray diffraction, Raman scattering and electron paramagnetic resonance | Zendy

Dzmitry Adamchuk | Zendy; V.K. Ksenevich | Zendy; N. A. Poklonski | Zendy; Marius Navickas | Zendy; J. Banys | Zendy

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Nonstoichiometric tin oxide films: study by X-ray diffraction, Raman scattering and electron paramagnetic resonance

Author(s) -

Dzmitry Adamchuk,

V.K. Ksenevich,

N. A. Poklonski,

Marius Navickas,

J. Banys

Publication year - 2020

Publication title -

lithuanian journal of physics

Language(s) - English

Resource type - Journals

SCImago Journal Rank - 0.269

H-Index - 16

eISSN - 2424-3647

pISSN - 1648-8504

DOI - 10.3952/physics.v59i4.4138

Subject(s) - tin , monoxide , sputtering , materials science , sputter deposition , analytical chemistry (journal) , raman spectroscopy , tin dioxide , amorphous solid , annealing (glass) , nanocrystalline material , thin film , chemistry , crystallography , nanotechnology , metallurgy , optics , physics , chromatography

The work was supported by the State Committee on Science and Technology of the Republic of Belarus (Grant No. F19LITG-001), Research Council of Lithuania (Grant No. S-LB-19-5), Belarusian National Research Program ‘Convergence-2020’ (subprogram ‘Integration’, Grant No. 3.3.1), and by Program of EU H2020-MSCA-RISE-2015 (Grants No. 691010 HUNTER and No. 690968 NANOGUARD2Ar).

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