Synchrotron Infrared Spectroscopy
Author(s) -
Jong-Seok Lee,
Tae Dong Kang,
Boknam Chae,
JaeYoung Kim
Publication year - 2012
Publication title -
physics and high technology
Language(s) - English
Resource type - Journals
ISSN - 1225-2336
DOI - 10.3938/phit.21.041
Subject(s) - synchrotron , infrared , infrared spectroscopy , synchrotron radiation , materials science , spectroscopy , physics , optics , astronomy , quantum mechanics
Today, most synchrotron facilities offer beamlines dedicated to infrared (IR) spectroscopy and IR microspectroscopy. The main advantage of synchrotron-based infrared spectroscopy is the brightness of the synchrotron radiation source which can provide a brightness two or three orders of magnitude higher than a thermal (black-body radiation) infrared source. Thus, synchrotron-based infrared spectroscopy allows a high spatial resolution (infrared microspectroscopy) and a high spectral resolution, especially for low-throughput technologies and far-infrared spectroscopy. In this article, a brief introduction to synchrotron-based infrared spectroscopy and its application will be given.
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