Open AccessOvercoming the Resolution Limit Using Striped Patterns: Structured Illumination Microscopy
Author(s) -
Yoobin KOH,
Eunseok JUNG,
Yeonsu Jung,
Euiheon Chung
Publication year - 2012
Publication title -
physics and high technology
Language(s) - English
Resource type - Journals
ISSN - 1225-2336
DOI - 10.3938/phit.21.022
Subject(s) - limit (mathematics) , resolution (logic) , microscopy , super resolution microscopy , optics , materials science , computer science , physics , artificial intelligence , scanning confocal electron microscopy , mathematics , mathematical analysis
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