Advances in STED Nanoscopy
Author(s) -
Kyu Young Han
Publication year - 2012
Publication title -
physics and high technology
Language(s) - English
Resource type - Journals
ISSN - 1225-2336
DOI - 10.3938/phit.21.020
Subject(s) - sted microscopy , physics , stimulated emission , optics , laser
Fluorescence microscopy is one of the most powerful tools in science and allows noninvasive characterization of a sample with high sensitivity and specificity. For a long time, however, details smaller than half the wavelength of light (∼200 nm) could not be resolved by using a conventional light microscope. Recently, to break diffraction barrier, researchers have demonstrated various super-resolution approaches, such as stimulated emission depletion (STED) microscopy, to a resolution of better than 20 nm. This review describes the principles and the features of STED microscopy, and its current advanced applications to physics, chemistry, material science and biology.
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