High-resolution Time-of-flight Measurement Using a Femtosecond Laser | Zendy

Seung-Woog KIM | Zendy; Joohyung Lee | Zendy; YoungJin Kim | Zendy; KeunWoo Lee | Zendy; Sanghyun Lee | Zendy

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High-resolution Time-of-flight Measurement Using a Femtosecond Laser

Author(s) -

Seung-Woog KIM,

Joohyung Lee,

YoungJin Kim,

KeunWoo Lee,

Sanghyun Lee

Publication year - 2010

Publication title -

physics and high technology

Language(s) - Hungarian

Resource type - Journals

ISSN - 1225-2336

DOI - 10.3938/phit.19.058

Subject(s) - femtosecond , laser , time of flight , resolution (logic) , materials science , aerospace engineering , optics , remote sensing , physics , computer science , engineering , geology , artificial intelligence

Cranfield Univ.(UK) (1984), (1984–1985) KAIST (1985‐) KI (2007‐), KAIST (2008‐ ), (2008‐2010), (2010‐) . (swk@kaist.ac.kr) KAIST (2007) KAIST . (joohyung.lee@kaist.ac.kr) KAIST (2008), KAIST (2008‐2010) KAIST . (yj.kim@kaist.ac.kr) KAIST (2009) KAIST . (kwl@kaist.ac.kr) (1994) (1995) 1995 KAIST . (shlee@satrec.kaist.ac.kr) High‐resolution Time‐of‐flight Measurement Using a Femtosecond Laser

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