Open AccessCharacterization of PVK Polymeric Material Using Rotating Polarizer and Analyzer Ellipsometer with a Speed Ratio 1:1
Author(s) -
Sofyan A. Taya,
Anas A. Alkanoo,
Taher M. ElAgez,
Ahed Afghjani
Publication year - 2016
Publication title -
science technology and development
Language(s) - English
Resource type - Journals
eISSN - 2414-8571
pISSN - 0254-6418
DOI - 10.3923/std.2016.16.21
Subject(s) - ellipsometry , polarizer , spectrum analyzer , characterization (materials science) , materials science , optics , nanotechnology , thin film , physics , birefringence
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