Processing of germanium for integrated circuits
Author(s) -
Ray Duffy,
Maryam Shayesteh,
Ran Yu
Publication year - 2014
Publication title -
turkish journal of physics
Language(s) - English
Resource type - Journals
eISSN - 1303-6122
pISSN - 1300-0101
DOI - 10.3906/fiz-1405-2
Subject(s) - integrated circuit , electronic circuit , key (lock) , computer science , transistor , germanium , focus (optics) , field (mathematics) , field effect transistor , electronic engineering , engineering physics , electrical engineering , materials science , optoelectronics , silicon , engineering , physics , mathematics , operating system , computer security , optics , voltage , pure mathematics
In this review paper the authors will focus on Ge processing for integrated circuits. The key areas that require the most attention are substrates and integration, gate dielectrics, and access resistance. We will discuss each of these topics in turn, while also reviewing the most scaled Ge eld-eect-transis tor devices, and consider how modelling
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