Atomic Force Microscope Surface Roughness Analysis of Surface Treated Ceramics

AIM: The purpose of this study was to evaluate the surface roughness of two types of ceramic after different surface treatments using an atomic force microscope (AFM). MATERIALS AND METHODS: One hundred sixty disks were fabricated of the two types of ceramic eighty disks of lithium disilicate (LD) (IPS e. max computer-aided design [CAD]) and eighty disks of hybrid ceramic (VITA Suprinity pc). Disks were subdivided into four groups according to the surface treatment (n = 20). Eighty disks of (IPS e. max CAD) were subdivided into LD I: control (no treatment), LD II: Sandblasting (Al2O3, 50 μm particle size), LD III: Hydrofluoric acid etching, and LD IV: Tribochemical surface treatment. Eighty disks of (VITA Suprinity pc) were subdivided into HD I: control (no treatment), HD II: Sandblasting (Al2O3, 50 μm particle size), HD III: Hydrofluoric acid etching, and HD IV: Tribochemical surface treatment. Then, surface treated disks surface roughness was analyzed by AFM (ThermoMicroscope, Bruker, Santa Barbara, CA, USA). The results were analyzed using SPSS program software version 25. Statistical analysis was done by one-way ANOVA and Tukey’s post hoc test with significance level 0.05. RESULTS: Tribochemical surface treatment groups of both types of ceramic L.D IV (279 ± 147 nm) and H.D IV (269.8 ± 142.2 nm) had the highest mean Ra values followed by surface abrasion with Al2O3 50 μ; L.D II (265.5 ± 140 nm), H.D II (204.5 ± 107.7 nm), hydrofluoric acid etching then control groups. CONCLUSION: Different surface treatments increased surface roughness significantly for both types of ceramic.