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Quantitative Atomic-Site Analysis of Functional Dopants/Point Defects in Crystalline Materials by Electron-Channeling-Enhanced Microanalysis
Author(s) -
Masahiro Ohtsuka,
Shunsuke Muto
Publication year - 2021
Publication title -
journal of visualized experiments
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.596
H-Index - 91
ISSN - 1940-087X
DOI - 10.3791/62015-v
Subject(s) - microanalysis , elemental analysis , materials science , spectroscopy , energy dispersive x ray spectroscopy , electron , scanning transmission electron microscopy , transmission electron microscopy , impurity , crystallographic defect , neutron activation analysis , scanning electron microscope , analytical chemistry (journal) , chemistry , crystallography , physics , nanotechnology , radiochemistry , organic chemistry , quantum mechanics , chromatography , composite material

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