
Tri-Node Upsets Self-Recovery Latch Design in 32 nm CMOS Technology
Author(s) -
Zhengfeng Huang,
Yang Guo,
Shangjie Pan,
Yingchun Lu,
Huaguo Liang,
Haochen Qi,
Yuanxin Ouyang,
Tianming Ni,
Qi Xu
Publication year - 2020
Publication title -
jisuanji fuzhu sheji yu tuxingxue xuebao
Language(s) - Uncategorized
Resource type - Journals
SCImago Journal Rank - 0.15
H-Index - 26
ISSN - 1003-9775
DOI - 10.3724/sp.j.1089.2020.18160
Subject(s) - cmos , node (physics) , computer science , embedded system , electronic engineering , engineering , structural engineering