Open AccessTHz-Enhanced DC Ultrafast Electron Diffractometer
Author(s) -
Dongfang Zhang,
Tobias Kroh,
Felix Ritzkowsky,
Timm Rohwer,
Moein Fakhari,
Hüseyin Çankaya,
Anne-Laure Calendron,
N. H. Matlis,
Franz X. Kärtner
Publication year - 2021
Publication title -
ultrafast science
Language(s) - English
Resource type - Journals
eISSN - 2097-0331
pISSN - 2765-8791
DOI - 10.34133/2021/9848526
Subject(s) - ultrashort pulse , ultrafast electron diffraction , terahertz radiation , diffractometer , materials science , electron , reflection high energy electron diffraction , optics , pulse duration , electron diffraction , full width at half maximum , optoelectronics , physics , diffraction , laser , scanning electron microscope , quantum mechanics
Terahertz- (THz-) based electron manipulation has recently been shown to hold tremendous promise as a technology for manipulating and driving the next generation of compact ultrafast electron sources. Here, we demonstrate an ultrafast electron diffractometer with THz-driven pulse compression. The electron bunches from a conventional DC gun are compressed by a factor of 10 and reach a duration of ~180 fs (FWHM) with 10,000 electrons/pulse at a 1 kHz repetition rate. The resulting ultrafast electron source is used in a proof-of-principle experiment to probe the photoinduced dynamics of single-crystal silicon. The THz-compressed electron beams produce high-quality diffraction patterns and enable the observation of the ultrafast structural dynamics with improved time resolution. These results validate the maturity of THz-driven ultrafast electron sources for use in precision applications.
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