Open AccessThe Effect of Annealing on Nano-Topography of SiO2 Film
Author(s) -
Assim A. Issa
Publication year - 2014
Publication title -
mağallaẗ ʻulūm al-rāfidayn
Language(s) - English
Resource type - Journals
eISSN - 2664-2786
pISSN - 1608-9391
DOI - 10.33899/rjs.2014.88647
Subject(s) - annealing (glass) , nanotopography , materials science , nano , root mean square , surface roughness , electrolyte , surface finish , grain size , atomic force microscopy , analytical chemistry (journal) , composite material , nanotechnology , chemical engineering , chemistry , electrical engineering , electrode , chromatography , engineering
Accelerating Research
Robert Robinson Avenue,
Oxford Science Park, Oxford
OX4 4GP, United Kingdom
Address
John Eccles HouseRobert Robinson Avenue,
Oxford Science Park, Oxford
OX4 4GP, United Kingdom