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Inspection of electroplated materials -- performance comparison with planar meander and mesh type magnetic sensor
Author(s) -
Subhas Chandra Mukhopadhyay,
Satoshi Yamada,
M. Iwahara
Publication year - 2002
Publication title -
international journal of applied electromagnetics and mechanics
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.239
H-Index - 30
eISSN - 1875-8800
pISSN - 1383-5416
DOI - 10.3233/jae-2002-461
Subject(s) - planar , meander (mathematics) , electroplating , materials science , acoustics , electrical engineering , composite material , engineering , computer science , geometry , physics , mathematics , layer (electronics) , computer graphics (images)

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