RF Analysis Of Electropolishing For EXFEL Cavities Production At Ettore Zanon SPA
Author(s) -
Sulimov, Alexey,
Gresele, A.,
Giaretta, M.,
Visentin, A.
Publication year - 2016
Language(s) - English
DOI - 10.3204/pubdb-2017-00929
After successful finishing of superconducting cavities mass production at Ettore Zanon S.p.A. (EZ) for the European XFEL (EXFEL), the authors had the possibility to provide a detailed analysis of the electropolishing (EP) process. The analysis of EP material removal is based on specified RF measurements and was used for the determination of both, the ratio between cavity’s iris and equator and uniformity in different cells. A comparison of the RF measurements results with mechanical measurements is presented
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