Open AccessElectrical characterization of aluminum (Al) thin films measured by using four- point probe method
Author(s) -
GP Panta,
DP Subedi
Publication year - 2013
Publication title -
kathmandu university journal of science engineering and technology
Language(s) - English
Resource type - Journals
ISSN - 1816-8752
DOI - 10.3126/kuset.v8i2.7322
Subject(s) - electrical resistivity and conductivity , materials science , thin film , aluminium , physical vapor deposition , characterization (materials science) , deposition (geology) , composite material , electrical conductor , electrical engineering , nanotechnology , paleontology , engineering , sediment , biology
Accelerating Research
Robert Robinson Avenue,
Oxford Science Park, Oxford
OX4 4GP, United Kingdom
Address
John Eccles HouseRobert Robinson Avenue,
Oxford Science Park, Oxford
OX4 4GP, United Kingdom