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Structural and electrical characterization of RCu5Sn compounds (R = Y, Gd, Tb, Dy, Ho, Er, and Tm)
Author(s) -
I. Romaniv,
L. Romaka,
B. Kuzhel,
V.V. Romaka,
M. RUDCHENKO,
Yu. Stadnyk,
M. Konyk,
М. Rudko
Publication year - 2019
Publication title -
chemistry of metals and alloys
Language(s) - English
Resource type - Journals
eISSN - 1998-8087
pISSN - 1998-8079
DOI - 10.30970/cma12.0374
Subject(s) - intermetallic , electrical resistivity and conductivity , materials science , arc melting , crystal structure , crystallography , rietveld refinement , atmospheric temperature range , powder diffraction , x ray crystallography , diffraction , chemistry , metallurgy , microstructure , thermodynamics , physics , alloy , quantum mechanics , optics
1 Department of Inorganic Chemistry, Ivan Franko National University of Lviv, Kyryla i Mefodiya St. 6, 79005 Lviv, Ukraine 2 Department of Materials Engineering and Applied Physics, Lviv Polytechnic National University, Ustyyanovycha St. 5, 79013 Lviv, Ukraine 3 Scientific-Technical and Educational Center of Low-Temperature Studies, Ivan Franko National University of Lviv, Dragomanova St. 50, 79005 Lviv, Ukraine * Corresponding author. E-mail: lyubov.romaka@lnu.edu.ua

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