Goodness-of-fit tests based on generalized Lorenz curve for progressively Type II censored data from a location-scale distributions
Author(s) -
Wonhee Lee,
Kyeongjun Lee
Publication year - 2019
Publication title -
communications for statistical applications and methods
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.326
H-Index - 6
eISSN - 2383-4757
pISSN - 2287-7843
DOI - 10.29220/csam.2019.26.2.191
Subject(s) - goodness of fit , statistics , mathematics , data set , monte carlo method , lorenz curve , scale (ratio) , statistical hypothesis testing , reliability (semiconductor) , power (physics) , mathematical analysis , gini coefficient , economic inequality , inequality , physics , quantum mechanics
The problem of examining how well an assumed distribution fits the data of a sample is of significant and must be examined prior to any inferential process. The observed failure time data of items are often not wholly available in reliability and life-testing studies. Lowering the expense and period associated with tests is important in statistical tests with censored data. Goodness-of-fit tests for perfect data can no longer be used when the observed failure time data are progressive Type II censored (PC) data. Therefore, we propose goodness-of-fit test statistics and a graphical method based on generalized Lorenz curve for PC data from a location-scale distribution. The power of the proposed tests is then assessed through Monte Carlo simulations. Finally, we analyzed two real data set for illustrative purposes.
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