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EQUIVALENT CIRCUIT ANALYSIS OF ARTIFICIAL DIELECTRIC LAYERS
Author(s) -
Eiichi Sano,
Masayuki Ikebe
Publication year - 2017
Publication title -
progress in electromagnetics research m
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.216
H-Index - 31
ISSN - 1937-8726
DOI - 10.2528/pierm17042801
Subject(s) - dielectric , materials science , composite material , optoelectronics
On the basis of equivalent circuit analysis, we investigated the electromagnetic characteristics of artificial dielectric layers (ADLs) having arrays of square metal patches for the normal incidence of plane waves, where the electromagnetic wavelength ranges from p/10 to p/2 (p: period). A good agreement was obtained between measured and calculated S parameters and electromagnetic parameters (permittivity and permeability) for a fabricated ADL except at around 5.2 and 9.2 GHz. A possible cause of the discrepancy between the measured and calculated electromagnetic characteristics is discussed by investigating the electromagnetic wave propagating along the surface of the ADL. Applications of the equivalent circuit analysis to ADLs with other geometries are also discussed.

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