DIFFRACTION AT THICK CURVED LAYERS WITH A NONUNIFORM DIELECTRIC PERMITTIVITY | Zendy

Ilya O. Sukharevsky | Zendy

AI Assistant Blog Pricing

Home ZAIA Blog

Open Access

DIFFRACTION AT THICK CURVED LAYERS WITH A NONUNIFORM DIELECTRIC PERMITTIVITY

Author(s) -

Ilya O. Sukharevsky

Publication year - 2019

Publication title -

progress in electromagnetics research b

Language(s) - English

Resource type - Journals

SCImago Journal Rank - 0.208

H-Index - 47

ISSN - 1937-6472

DOI - 10.2528/pierb18092512

Subject(s) - diffraction , dielectric , materials science , permittivity , dielectric permittivity , relative permittivity , optics , composite material , physics , optoelectronics

In this paper, we obtain an asymptotic solution for the problem of electromagnetic diffraction at a thick curved dielectric layer with a nonuniform dielectric permittivity. We show that, in the case of thick layers, the main asymptotic approximation already comprises the curvature correction, verify the results by comparison with a solution obtained with the integral equation method, and offer to approximate the piecewise constant dielectric permittivity of a stratified layer with a continuous function.

The content you want is available to Zendy users.

Already have an account? Click here to sign in.

Having issues? You can contact us here

Accelerating Research