AN IMPROVED METHOD FOR MICROWAVE NONDESTRUCTIVE DIELECTRIC MEASUREMENT OF LAYERED MEDIA | Zendy

Huiyu Zhang | Zendy; S.Y. Tan | Zendy; H.S. Tan | Zendy

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AN IMPROVED METHOD FOR MICROWAVE NONDESTRUCTIVE DIELECTRIC MEASUREMENT OF LAYERED MEDIA

Author(s) -

Huiyu Zhang,

S.Y. Tan,

H.S. Tan

Publication year - 2008

Publication title -

progress in electromagnetics research b

Language(s) - English

Resource type - Journals

SCImago Journal Rank - 0.208

H-Index - 47

ISSN - 1937-6472

DOI - 10.2528/pierb08082701

Subject(s) - microwave , materials science , permittivity , reflection coefficient , dielectric , optics , aperture (computer memory) , reflection (computer programming) , inverse problem , nondestructive testing , conductor , microwave imaging , computational physics , acoustics , optoelectronics , physics , computer science , mathematical analysis , composite material , telecommunications , mathematics , quantum mechanics , programming language

This paper presents an improved method for microwave nondestructive dielectric measurement of layered media using a parallel-plate waveguide probe. The method bases on measuring the S parameter S11 or reflection coefficient from the N-layer media over the range of 1 to 10 GHz. Formulation for the aperture admittance is presented which allows the solving of the inverse problem of extracting the complex permittivity for two cases of the media, (1) one that terminates into an infinite half-space, (2) one that terminates into a sheet conductor. Our theoretical analysis allows the study of the effects of air gaps and slab thickness on the probe measurements. Through numerical simulations, the ability to use the proposed method for dielectric spectroscopy and thickness evaluation of layered media is demonstrated.

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