HIGH PERFORMANCE SILICON-BASED INDUCTORS FOR RF INTEGRATED PASSIVE DEVICES
Author(s) -
Mei Han,
Gaowei Xu,
Le Luo
Publication year - 2014
Publication title -
electromagnetic waves
Language(s) - English
Resource type - Journals
eISSN - 1559-8985
pISSN - 1070-4698
DOI - 10.2528/pier14040803
Subject(s) - inductor , silicon , materials science , optoelectronics , electrical engineering , electronic engineering , engineering , voltage
High-Q inductors are realized on a 3–8Ω · cm silicon substrate in the buildup of BCB/Cu. Anisotropic wet etching is utilized to remove the silicon in the cavities underneath the spirals from the backside. Examples of 3.5-turn spiral inductors with and without cavity are compared, and their parameter extractions are accomplished with an equivalent circuit model. Compared to the inductor without cavity, the measured peak quality factor of a 8.19-nH inductor with cavity increases from 24 at 0.8GHz to 39 at 2.5 GHz by 67%, and the inductor with cavity has a wider bandwidth using the same equivalent model. The inductors utilizing this technique have a potential wide application in hand-held RF modules either as part of an off-chip device or as an integrated passive in a silicon interposer.
Accelerating Research
Robert Robinson Avenue,
Oxford Science Park, Oxford
OX4 4GP, United Kingdom
Address
John Eccles HouseRobert Robinson Avenue,
Oxford Science Park, Oxford
OX4 4GP, United Kingdom