English (United Kingdom)

https://curated-unify.zendy.io/wp-json/zendy-region/v1/featured_content/oa?rat=en

https://curated-unify.zendy.io/wp-json/zendy-region/v1/highlighted_journal/

Global: Zendy Plus annual

Presents the access of premium content as premium feature

Premium Content

Presents the keyphrase highlighting as premium feature

Keyphrase Highlighting

Presents the summarisation as premium feature

Summarisation

Insights

Presents the pdf analysis as premium feature

PDF Analysis

Presents the zaia usage as premium feature

ZAIA

Global: Zendy Tools annual

Global: Zendy Free Plan

Global: Zendy Tools monthly

Global: Zendy Plus monthly

A network analyzer with a bulk current injection (BCI) probe is proposed to measure the common-mode conversion coe-cient for DC supply loops on a driver PCB of thin fllm transistor-liquid crystal display (TFT-LCD) panel. The proposed technique is used to predict the common-mode radiated emission caused by the DC supply loops, which highly correlates with the radiated emission measurements obtained for the TFT-LCD panel in a fully anechoic chamber (FAC). The proposed technique is also successful to estimate the reduction of a speciflc peak in the radiated emission spectrum by shielding the DC supply loops on a driver PCB of TFT-LCD panel. Electromagnetic simulation and equivalent-circuit modeling approaches are developed to conflrm the common-mode radiation mechanism in this study.

ESTIMATING THE REDUCTION OF RADIATED EMISSIONS FROM TFT-LCD PANEL USING NETWORK ANALYZER WITH A BULK CURRENT INJECTION PROBE