ESTIMATING THE REDUCTION OF RADIATED EMISSIONS FROM TFT-LCD PANEL USING NETWORK ANALYZER WITH A BULK CURRENT INJECTION PROBE
Author(s) -
Cheng-Yu Ho,
Kai-Syuan Chen,
TzyySheng Horng,
JianMing Wu
Publication year - 2013
Publication title -
electromagnetic waves
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.437
H-Index - 89
eISSN - 1559-8985
pISSN - 1070-4698
DOI - 10.2528/pier13041115
Subject(s) - spectrum analyzer , liquid crystal display , current (fluid) , reduction (mathematics) , thin film transistor , network analyzer (electrical) , materials science , optoelectronics , environmental science , electronic engineering , electrical engineering , engineering , nanotechnology , mathematics , geometry , layer (electronics)
A network analyzer with a bulk current injection (BCI) probe is proposed to measure the common-mode conversion coe-cient for DC supply loops on a driver PCB of thin fllm transistor-liquid crystal display (TFT-LCD) panel. The proposed technique is used to predict the common-mode radiated emission caused by the DC supply loops, which highly correlates with the radiated emission measurements obtained for the TFT-LCD panel in a fully anechoic chamber (FAC). The proposed technique is also successful to estimate the reduction of a speciflc peak in the radiated emission spectrum by shielding the DC supply loops on a driver PCB of TFT-LCD panel. Electromagnetic simulation and equivalent-circuit modeling approaches are developed to conflrm the common-mode radiation mechanism in this study.
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