A HIGH ORDER INTEGRAL SPM FOR THE CONDUCTING ROUGH SURFACE SCATTERING WITH THE TAPERED WAVE INCIDENCE-TE CASE
Author(s) -
Lixin Guo,
Yu Liang,
Jie Li,
Zhensen Wu
Publication year - 2011
Publication title -
electromagnetic waves
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.437
H-Index - 89
eISSN - 1559-8985
pISSN - 1070-4698
DOI - 10.2528/pier11011605
Subject(s) - scattering , surface (topology) , rough surface , incidence (geometry) , optics , surface wave , order (exchange) , physics , mathematics , mathematical analysis , materials science , geometry , composite material , finance , economics
Based on the Helmholtz integral equation and series expansion theory, a high order integral small perturbation method (HISPM) for studying electromagnetic wave scattering from the flnite conducting rough surface with tapered transverse electric (TE) wave incidence is presented. The high order scattering coe-cients are obtained by the series expansion, the validity and accuracy of HISPM is verifled through numerical evaluation with classical small perturbation method (CSPM) and the method of moments (MOM) By comparing with CSPM for the inflnite rough surface case with plane wave incidence, the presented HISPM can greatly reduce the edge difiraction efiect. HISPM also shows advantages in the memory requirement and computational time, especially in calculating scattering coe-cients with low grazing angle incidence. Numerical examples are given to show that with the increasing of the length of the rough surface, the memory requirements and the computation time of HISPM are dramatically reduced compared to those of MOM.
Accelerating Research
Robert Robinson Avenue,
Oxford Science Park, Oxford
OX4 4GP, United Kingdom
Address
John Eccles HouseRobert Robinson Avenue,
Oxford Science Park, Oxford
OX4 4GP, United Kingdom