MICROWAVE METHOD FOR THICKNESS-INDEPENDENT PERMITTIVITY EXTRACTION OF LOW-LOSS DIELECTRIC MATERIALS FROM TRANSMISSION MEASUREMENTS | Zendy

Uğur Cem Hasar | Zendy

Open Access

MICROWAVE METHOD FOR THICKNESS-INDEPENDENT PERMITTIVITY EXTRACTION OF LOW-LOSS DIELECTRIC MATERIALS FROM TRANSMISSION MEASUREMENTS

Author(s) -

Uğur Cem Hasar

Publication year - 2010

Publication title -

electromagnetic waves

Language(s) - English

Resource type - Journals

SCImago Journal Rank - 0.437

H-Index - 89

eISSN - 1559-8985

pISSN - 1070-4698

DOI - 10.2528/pier10101208

Subject(s) - permittivity , materials science , microwave , dielectric , extraction (chemistry) , dielectric loss , dielectric permittivity , relative permittivity , transmission (telecommunications) , optoelectronics , computer science , telecommunications , chromatography , chemistry

A non-resonant microwave method has been proposed for complex permittivity determination of low-loss materials with no prior information of sample thickness. The method uses two measurement data of maximum/minimum value of the magnitude of transmission properties of the sample to determine an initial guess for permittivity and flnd the sample thickness. An explicit expression for sample thickness and two expressions for inversion of the complex permittivity of the sample are derived. The method has been validated by transmission measurements at X-band (8.2{12.4GHz) of a low-loss sample located into a waveguide sample holder.

The content you want is available to Zendy users.

Already have an account? Click here to sign in.

Having issues? You can contact us here

Accelerating Research