BEAM COMPRESSED SYSTEM FOR MEASURING INHOMOGENEITY AND IRREGULARITY OF DIELECTRIC PLATE WITH HIGHER SPATIAL RESOLUTION POWER

The measurement of inhomogeneity and irregularity of dielectric plate requires metering equipments with high spatial resolution power and contactless method. As we know, a measurement system with thin beam has high spatial resolution power. In this paper, a beam compressed system (BCS) is proposed to improve the spatial resolution power for measuring inhomogeneity and irregularity of dielectric plate at millimeter wave band. The beam shape of the BCS has to be carefully designed to achieve a very thin shape which has to be constant over a long range. The BCS can be applied to detect inhomogeneity and irregularity of a dielectric plate from cell to cell with its thin beam. Simulations with FDTD and FEM and experiments are carried out to confirm the performance of the designed BCS, both simulation and experimental results have good agreement. And the images of the permittivity or thickness variance of dielectric plate are given to demonstrate the advantages of the BCS over traditional Gaussian beam measuring method.