Electron Stark Broadening Database for Atomic N, O, and C Lines
Author(s) -
Yen Liu,
Winifred M. Huo,
A. A. Wray,
D. F. Carbon
Publication year - 2012
Publication title -
nasa sti repository (national aeronautics and space administration)
Language(s) - English
Resource type - Conference proceedings
DOI - 10.2514/6.2012-2739
Subject(s) - stark effect , electron , atomic physics , materials science , database , physics , spectral line , computer science , nuclear physics , astronomy
A database for efficiently computing the electron Stark broadening line widths for atomic N, O, and C lines is constructed. The line width is expressed in terms of the electron number density and electronatom scattering cross sections based on the Baranger impact theory. The state-to-state cross sections are computed using the semiclassical approximation, in which the atom is treated quantum mechanically whereas the motion of the free electron follows a classical trajectory. These state-to-state cross sections are calculated based on newly compiled line lists. Each atomic line list consists of a careful merger of NIST, Vanderbilt, and TOPbase line datasets from wavelength 50 nm to 50 micrometers covering the VUV to IR spectral regions. There are over 10,000 lines in each atomic line list. The widths for each line are computed at 13 electron temperatures between 1,000 K 50,000 K. A linear least squares method using a four-term fractional power series is then employed to obtain an analytical fit for each line-width variation as a function of the electron temperature. The maximum L2 error of the analytic fits for all lines in our line lists is about 5%.
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