Advanced Stirling Convertor Heater Head Durability and Reliability Quantification
Author(s) -
Ashwin Shah,
Igor Korovaichuk,
Dave Krause,
Sreeramesh Kalluri
Publication year - 2008
Publication title -
6th international energy conversion engineering conference (iecec)
Language(s) - English
Resource type - Conference proceedings
DOI - 10.2514/6.2008-5772
Subject(s) - durability , stirling engine , reliability (semiconductor) , head (geology) , stirling cycle , reliability engineering , computer science , automotive engineering , environmental science , engineering , mechanical engineering , physics , geology , power (physics) , thermodynamics , database , geomorphology
oC) is a key design driver for durability. Inherent uncertainties in the creep behavior of the thin-walled heater head and the variations in the wall thickness, control temperature, and working gas pressure need to be accounted for in the life and reliability prediction. Due to the availability of very limited test data, assuring life and reliability of the HH is a challenging task. The NASA Glenn Research Center (GRC) has adopted an integrated approach combining available uniaxial MarM-247 material behavior testing, HH benchmark testing and advanced analysis in order to demonstrate the integrity, life and reliability of the HH under expected mission conditions. The proposed paper describes analytical aspects of the deterministic and probabilistic approaches and results. The deterministic approach involves development of the creep constitutive model for the MarM-247 (akin to the Oak Ridge National Laboratory master curve model used previously for Inconel 718) and nonlinear finite element analysis to predict the mean life. The probabilistic approach includes evaluation of the effect of design variable uncertainties in material creep behavior, geometry and operating conditions on life and reliability for the expected life. The sensitivity of the uncertainties in the design variables on the heater head reliability is also quantified, and guidelines to improve reliability are discussed.
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