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Performance Evaluations of Ceramic Wafer Seals
Author(s) -
Patrick H. Dunlap,
Jeffrey J. DeMange,
Bruce M. Steinetz
Publication year - 2006
Publication title -
nasa sti repository (national aeronautics and space administration)
Language(s) - English
Resource type - Conference proceedings
DOI - 10.2514/6.2006-4934
Subject(s) - wafer , ceramic , materials science , computer science , optoelectronics , composite material
Future hypersonic vehicles will require high temperature, dynamic seals in advanced ramjet/scramjet engines and on the vehicle airframe to seal the perimeters of movable panels, flaps, and doors. Seal temperatures in these locations can exceed 2000 F, especially when the seals are in contact with hot ceramic matrix composite sealing surfaces. NASA Glenn Research Center is developing advanced ceramic wafer seals to meet the needs of these applications. High temperature scrub tests performed between silicon nitride wafers and carbon-silicon carbide rub surfaces revealed high friction forces and evidence of material transfer from the rub surfaces to the wafer seals. Stickage between adjacent wafers was also observed after testing. Several design changes to the wafer seals were evaluated as possible solutions to these concerns. Wafers with recessed sides were evaluated as a potential means of reducing friction between adjacent wafers. Alternative wafer materials are also being considered as a means of reducing friction between the seals and their sealing surfaces and because the baseline silicon nitride wafer material (AS800) is no longer commercially available.

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