Open AccessIn-Situ Imaging of Crack Growth with Piezoelectric Wafer Active Sensors
Author(s) -
Victor Giurgiutiu,
Christopher Jenkins,
James R. Kendall,
Lingyu Yu
Publication year - 2006
Publication title -
citeseer x (the pennsylvania state university)
Language(s) - English
Resource type - Conference proceedings
DOI - 10.2514/6.2006-2114
Subject(s) - wafer , piezoelectricity , in situ , materials science , acoustics , optoelectronics , composite material , chemistry , physics , organic chemistry
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